International Test Conference is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. This 3 days event is being organized by IEEE Advancing Technology for Humanity. The venue of this event is Fort Worth Convention Center (FWCC) which is located in Fort Worth, Texas, United States of America. The event will be held from 15 November 2016, Tuesday to 17 November 2016, Thursday. International Test Conference 2016 will showcase a wide range of products and services related to electronics, electricals & lighting sectors from the leading exhibitors. The approximate number of exhibitors that will exhibit at this event is over 50. Over 4,000 visitors are expected at this event. Visitor profile of this event includes academia, design tool and equipment suppliers, designers, and test engineers. The frequency of International Test Conference is annual. This event has been running since 1970.